Emerging Nonotechnologies:test , defect tolerance and reliability Mohammad Tehranipoor
Series: Frontiers in electronic testingPublication details: Springer 2008 New YorkDescription: xii;405pISBN:- 9780387747460
- 620.5 TEH
Item type | Current library | Collection | Call number | Status | Date due | Barcode | |
---|---|---|---|---|---|---|---|
Books | Shyam Lal College Library | Physics | 617.60028 TEH (Browse shelf(Opens below)) | Available | 78371 |
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