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Emerging Nonotechnologies:test , defect tolerance and reliability

Tehranipoor, Mohammad

Emerging Nonotechnologies:test , defect tolerance and reliability Mohammad Tehranipoor - New York Springer 2008 - xii;405p. - Frontiers in electronic testing .

ISBN: 9780387747460

Subjects--Topical Terms:
Nanotechnology. Microtechnology. Technology & Engineering-- Nanotechnology & MEMS.

Dewey Class. No.: 620.5 TEH

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