Emerging Nonotechnologies:test , defect tolerance and reliability Mohammad Tehranipoor

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Series: Frontiers in electronic testingPublication details: Springer 2008 New YorkDescription: xii;405pISBN:

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Holdings
Item type	Current library	Collection	Call number	Status	Date due	Barcode
Books	Shyam Lal College Library	Physics	617.60028 TEH (Browse shelf(Opens below))	Available		78371

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