Emerging Nonotechnologies:test , defect tolerance and reliability (Record no. 32308)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 00491 a2200145 4500 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 9780387747460 |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 620.5 TEH |
| 100 ## - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Tehranipoor, Mohammad |
| 245 ## - TITLE STATEMENT | |
| Title | Emerging Nonotechnologies:test , defect tolerance and reliability |
| Statement of responsibility, etc | Mohammad Tehranipoor |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
| Name of publisher, distributor, etc | Springer |
| Date of publication, distribution, etc | 2008 |
| Place of publication, distribution, etc | New York |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | xii;405p. |
| 440 ## - SERIES STATEMENT/ADDED ENTRY--TITLE | |
| Series Title | Frontiers in electronic testing |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name as entry element | Nanotechnology. Microtechnology. Technology & Engineering-- Nanotechnology & MEMS. |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Source of classification or shelving scheme | Dewey Decimal Classification |
| Koha item type | Books |
| Withdrawn status | Lost status | Source of classification or shelving scheme | Damaged status | Not for loan | Collection code | Home library | Current library | Date acquired | Source of acquisition | Currency | Cost, normal purchase price | Bill Number | Full call number | Barcode | Date last seen | Cost, replacement price | Bill Date | Koha item type |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Dewey Decimal Classification | Physics | Shyam Lal College Library | Shyam Lal College Library | 26/11/2021 | 2 | GBP | 13415.00 | 9322 | 617.60028 TEH | 78371 | 26/11/2021 | 16769.16 | 26/11/2021 | Books |