TY  - GEN
AU  - Tehranipoor, Mohammad
TI  - Emerging Nonotechnologies:test , defect tolerance and reliability
SN  - 9780387747460
U1  - 620.5 TEH 
PY  - 2008///
CY  - New York
PB  - Springer
KW  - Nanotechnology. Microtechnology. Technology & Engineering-- Nanotechnology & MEMS
ER  -